|Lines of code analyzed||9,377|
|On Coverity Scan since||Feb 24, 2014|
|Last build analyzed||a while ago|
|License||APSL (Apple Public Source License )|
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|Line of Code (LOC)||Defect Density|
|Less than 100,000||0.35|
|100,000 to 499,999||0.5|
|500,000 to 1 million||0.7|
|More than 1 million||0.65|
Note: Defect density is measured by the number of defects per 1,000 lines of code, identified by the Coverity platform. The numbers shown above are from our 2013 Coverity Scan Report, which analyzed 250 million lines of open source code.
Note: Defect density is measured by the number of defects per 1,000 lines of code.
|Component Name||Pattern||Ignore||Line of Code||Defect density|
No top 25 CWE defects were found.
Coverity Scan tests every line of code and potential execution path. The root cause of each defect is clearly explained, making it easy to fix bugs.
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