Coverity Scan: CT800

Analysis Metrics

Version: 1.46

See how defect density for 'CT800' compares with defect density for other open source projects.  Learn more

Note: Defect density is measured by the number of defects per 1,000 lines of code.

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Analysis Metrics per Components

Component Name	Pattern	Ignore	Line of Code	Defect density
Coverity_Headers	.*/cov-int/emit/.*	Yes	0	N/A
App_Embedded	.*/source/application/.*	No	34,836	0.00
App_UCI	.*/source/application-uci/.*	No	28,186	0.00
Book_Tool	.*/tools/booktool/.*	No	1,718	0.00
CRC_Tool	.*/tools/crctool/.*	No	308	0.00
KPK_Bitbase	.*/tools/kpk/.*	No	249	0.00
GCC_ARM_7_3	.*/gcc-arm-none-eabi-7_3_Q2/.*	Yes	0	N/A
GCC_WIN32_7_3	.*/mingw-w64/i686-7.3.0-posix-dwarf-rt_v5-rev0/.*	Yes	0	N/A
GCC_WIN64_7_3	.*/mingw-w64/x86_64-7.3.0-posix-seh-rt_v5-rev0/.*	Yes	0	N/A
Coverity	.*/cov-analysis-win64-2019.03/.*	Yes	0	N/A
ARM_GCC_Coverity	/opt/.*	Yes	641	N/A
Build_Chain_Linux	/usr/.*	Yes	10,677	N/A
Other	.*	No	0	N/A

CWE Top 25 defects

ID	CWE-Name	Number of Defects
120	Buffer Copy without Checking Size of Input ('Classic Buffer Overflow')	1
190	Integer Overflow or Wraparound	2

About Coverity Scan Static Analysis

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