Coverity Scan: Ephoto

Project Name Ephoto
Lines of code analyzed 66,216
On Coverity Scan since Jul 25, 2016
Last build analyzed 3 months ago
   
Language C/C++
Repository URL git://git.enlightenment.org/apps/ephoto.git
Homepage URL www.smhouston.us/ephoto/
License BSD3Clause (BSD 3-Clause "New" or "Revised" License )

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Analysis Metrics

Version: Ephoto\ 1.5

Sep 06, 2017
Last Analyzed
66,216
Lines of Code Analyzed
0.00
Defect Density

Defect changes since previous build dated Apr 18, 2017

0
Newly detected
2
Eliminated

Defects by status for current build

13
Total defects
0
Outstanding
11
Fixed
See how defect density for 'Ephoto' compares with defect density for other open source projects.  Learn more

Note: Defect density is measured by the number of defects per 1,000 lines of code.


Analysis Metrics per Components

Component Name Pattern Ignore Line of Code Defect density
Edje .*/data/themes/.* Yes 0 N/A
Other .* No 67,177 0.00

CWE Top 25 defects

ID CWE-Name Number of Defects
676 Use of Potentially Dangerous Function 2
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About Coverity Scan Static Analysis

Find and fix defects in your C/C++, Java, JavaScript or C# open source project for free.

Coverity Scan tests every line of code and potential execution path. The root cause of each defect is clearly explained, making it easy to fix bugs.

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