Coverity Scan: tiff

Analysis Metrics

Version: devel-2026-08-18

See how defect density for 'tiff' compares with defect density for other open source projects.  Learn more

Note: Defect density is measured by the number of defects per 1,000 lines of code.

---

Analysis Metrics per Components

Component Name	Pattern	Ignore	Line of Code	Defect density
fax2ps	.*/tools/fax2ps\.c$	No	422	0.00
fax2tiff	.*/tools/fax2tiff\.c$	No	458	0.00
mkg3states	.*/tools/mkg3states\.c$	No	215	0.00
pal2rgb	.*/tools/pal2rgb\.c$	No	473	0.00
ppm2tiff	.*/tools/ppm2tiff\.c$	No	505	0.00
raw2tiff	.*/tools/raw2tiff\.c$	No	895	0.00
rgb2ycbcr	.*/tools/rgb2ycbcr\.c$	No	0	N/A
thumbnail	.*/tools/thumbnail\.c$	No	0	N/A
tiff2bw	.*/tools/tiff2bw\.c$	No	565	0.00
tiff2pdf	.*/tools/tiff2pdf\.c$	No	6,072	0.16
tiff2ps	.*/tools/tiff2ps\.c$	No	3,010	0.00
tiff2rgba	.*/tools/tiff2rgba\.c$	No	534	0.00
tiffcmp	.*/tools/tiffcmp\.c$	No	701	0.00
tiffcp	.*/tools/tiffcp\.c$	No	2,318	0.00
tiffcrop	.*/tools/tiffcrop\.c$	No	10,757	0.19
tiffdither	.*/tools/tiffdither\.c$	No	338	0.00
tiffdump	.*/tools/tiffdump\.c$	No	896	0.00
tiffgt	.*/tools/tiffgt\.c$	No	438	2.28
tiffinfo	.*/tools/tiffinfo\.c$	No	730	0.00
tiffmedian	.*/tools/tiffmedian\.c$	No	919	0.00
tiffset	.*/tools/tiffset\.c$	No	449	0.00
tiffsplit	.*/tools/tiffsplit\.c$	No	377	0.00
tools_common	.*/tools/tiff_tools\.[ch]$	No	48	0.00
contrib_addtiffo	.*/contrib/addtiffo/[^\.]*\.[ch]$	No	1,605	2.49
contrib	.*/contrib/(?!addtiffo).*/[^\.]*\.[ch]$	No	1,246	0.00
port files	.*/port/[^/]*$	No	21	0.00
libtiff config	^\.[^/]*$	No	0	N/A
system headers	^/usr/include/.*	Yes	69,498	N/A
gcc headers	^/usr/lib/gcc/.*	Yes	3,970	N/A
local headers	^/usr/local/include/.*	Yes	1,195	N/A
libtiff	.*/libtiff/[^/]*(\.c|\.h|\.hxx|\.cxx)$	No	43,430	0.02
Other	.*	No	0	N/A

CWE Top 25 defects

ID	CWE-Name	Number of Defects
190	Integer Overflow or Wraparound	3

About Coverity Scan Static Analysis

Find and fix defects in your C/C++, Java, JavaScript or C# open source project for free.

Coverity Scan tests every line of code and potential execution path. The root cause of each defect is clearly explained, making it easy to fix bugs.