|Lines of code analyzed||16,503|
|On Coverity Scan since||Dec 01, 2015|
|Last build analyzed||a while ago|
|License||MIT (MIT license )|
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|Line of Code (LOC)||Defect Density|
|Less than 100,000||0.35|
|100,000 to 499,999||0.5|
|500,000 to 1 million||0.7|
|More than 1 million||0.65|
Note: Defect density is measured by the number of defects per 1,000 lines of code.
No top 25 CWE defects were found.
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